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Related Experiment Video

Updated: Aug 16, 2025

Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator
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Phase retrieval of two random phase-shifting interferograms using Zernike coefficient extraction network.

Ketao Yan, WenJun Yu, Congping Chen

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    |December 23, 2022
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    This study introduces a deep learning approach for phase retrieval using two interferograms, simplifying the process by extracting Zernike coefficients. This method accurately reconstructs phase distribution without pre-filtering or unwrapping, achieving high precision.

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    Area of Science:

    • Optics
    • Image Processing
    • Machine Learning

    Background:

    • Phase retrieval is crucial in optical metrology.
    • Traditional methods often require complex pre-processing steps like filtering and phase unwrapping.
    • Existing techniques may struggle with random phase shifts.

    Purpose of the Study:

    • To develop a novel deep learning method for accurate phase retrieval.
    • To simplify the phase retrieval process by eliminating the need for pre-filtering and phase unwrapping.
    • To address phase retrieval challenges with random phase shifts.

    Main Methods:

    • Phase retrieval is reformulated as a Zernike coefficient extraction problem.
    • A deep learning model is employed to extract Zernike coefficients from two interferograms.
    • Phase distribution is reconstructed using Zernike polynomials.

    Main Results:

    • The method successfully extracts Zernike coefficients from interferograms with random phase shifts.
    • Simulated data analysis shows a root mean square (RMS) phase error of 0.01 λ.
    • Experimental validation confirms the method's effectiveness on measured data.

    Conclusions:

    • The proposed deep learning method offers an efficient and accurate solution for phase retrieval.
    • Elimination of pre-filtering and phase unwrapping simplifies the overall process.
    • The technique demonstrates robustness and applicability to real-world optical measurements.