Infrared (IR) Spectroscopy: Overview
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Georgi V Georgiev1, Wei Cao1, Weiwei Zhang1
1Optoelectronics Research Centre, University of Southampton, Southampton SO17 1BJ, UK.
Advancements in group IV photonic modulators are crucial for meeting future data demands. This review covers near-IR, mid-IR, and long-wave infrared developments, highlighting high data rates and new platforms.
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