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Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method.

Binbin Wang1, David W McComb1

  • 1Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH 43212, USA; Material Science and Engineering, The Ohio State University, Columbus, OH 43212, USA.

Ultramicroscopy
|December 26, 2022
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Summary

We developed a new phase imaging method for scanning transmission electron microscopy. This technique offers dose-efficient, noise-robust imaging of atomic structures and magnetic phases with high resolution.

Keywords:
Atomic resolutionDirect detectorMagnetic/electric fieldPhase retrievalTEM

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Area of Science:

  • Materials Science
  • Physics
  • Microscopy

Background:

  • Scanning transmission electron microscopy (STEM) is a powerful tool for materials characterization.
  • Phase imaging in STEM is crucial for visualizing light elements and subtle structural details.
  • Existing phase imaging methods can be limited by dose efficiency, noise robustness, or resolution.

Purpose of the Study:

  • To introduce a novel phase imaging mechanism for STEM.
  • To provide a straightforward, dose-efficient, and noise-robust phase imaging technique.
  • To demonstrate its capability across various length scales and sample types.

Main Methods:

  • Exploiting complementary intensity changes of transmitted disks at different scattering angles.
  • Utilizing probe defocus as a variable parameter.
  • Applying the method to atomic resolution imaging and nanoscale magnetic phase imaging in FeGe.

Main Results:

  • Achieved atomic resolution phase imaging capable of detecting both light and heavy atomic columns.
  • Successfully imaged nanoscale magnetic phases in FeGe samples.
  • Demonstrated higher effective spatial resolution and robustness to background contrast compared to conventional methods.

Conclusions:

  • The developed phase imaging mechanism is a significant advancement for STEM.
  • It offers a versatile and robust approach for materials characterization from atomic to mesoscopic scales.
  • The method has broad potential for characterizing emerging materials and can be extended to other scanning transmission techniques.