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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Saima Batool1, Muhammad Idrees2, Su-Ting Han3
1Institute for Advanced Study, Shenzhen University, Shenzhen, 518060, P. R. China.
Electrical contact models struggle at the nanoscale due to material variations. This review covers challenges and solutions for low-resistance electrical contacts in 2D materials for next-gen electronics.
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