End-to-end differentiable blind tip reconstruction for noisy atomic force microscopy images

Yasuhiro Matsunaga1, Sotaro Fuchigami2, Tomonori Ogane3

  • 1Graduate School of Science and Engineering, Saitama University, Saitama, 338-8570, Japan. ymatsunaga@mail.saitama-u.ac.jp.

Scientific Reports
|January 4, 2023
PubMed
Summary

A new machine learning approach improves atomic force microscopy (AFM) image analysis by accurately reconstructing molecular shapes. This end-to-end differentiable blind tip reconstruction method is robust against noise, enhancing biomolecular dynamics studies.