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    Area of Science:

    • Optics and Photonics
    • Computer Vision
    • Metrology

    Background:

    • Phase measuring profilometry (PMP) is a leading 3D sensing technique known for high accuracy.
    • Commercial projectors, widely used in PMP, introduce nonlinear phase errors due to their inherent gamma effect, impacting measurement precision.
    • These errors stem from high-order harmonics in captured phase-shifting patterns.

    Purpose of the Study:

    • To develop and validate a novel full-field nonlinear error compensation method for PMP.
    • To mitigate the impact of gamma effects on the accuracy of 3D measurements.
    • To enhance the reliability and precision of structured light-based 3D sensing systems.

    Main Methods:

    • A new nonlinear error compensation method was proposed for PMP.
    • The method involves averaging multiple reference plane phase measurements to reduce random errors.
    • An expected phase plane is fitted using the least-squares method, and nonlinear errors are detected by phase subtraction. A look-up table (LUT) is generated for efficient error correction.
    • The unwrapped phase of an object is used to directly search the LUT for corresponding nonlinear error compensation.

    Main Results:

    • The proposed method effectively compensates for full-field nonlinear phase errors.
    • Experimental results demonstrate significant improvements in accuracy.
    • Mean Absolute Error (MAE) improved from 0.48 mm to 0.06 mm.
    • Root Mean Square Error (RMSE) improved from 0.55 mm to 0.07 mm.

    Conclusions:

    • The developed method is feasible and valid for compensating nonlinear phase errors in PMP.
    • This approach enhances the accuracy of 3D measurements obtained using commercial projectors.
    • The study offers an efficient solution for improving the performance of structured light 3D sensing systems.