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Updated: Aug 15, 2025

Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator
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High-quality binary fringe generation by multi-scale optimization on intensity and phase.

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    Summary
    This summary is machine-generated.

    A new method optimizes binary fringe patterns for structured light measurement, reducing phase errors and improving robustness across projector defocus levels. This technique enhances fringe quality for more accurate 3D measurements.

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    Area of Science:

    • Optics and Photonics
    • Computer Vision
    • Metrology

    Background:

    • Structured light measurement relies on projected fringe patterns.
    • Existing binary fringe generation methods struggle with projector defocus, leading to phase errors.
    • Current methods optimize at a single defocus scale, limiting robustness.

    Purpose of the Study:

    • To develop a novel method for binary fringe generation that is robust to projector defocus.
    • To reduce phase errors and improve the quality of projected fringes in structured light measurement.
    • To enhance the overall accuracy and reliability of 3D reconstruction using structured light.

    Main Methods:

    • A new optimization-based method for generating binary fringe patterns.
    • Simultaneous optimization of fringe intensity and phase across multiple defocus scales.
    • Algorithm acceleration using block optimization and an objective index evaluation strategy for binary patch selection.

    Main Results:

    • The proposed method effectively reduces phase errors in projected binary fringes.
    • Generated fringes demonstrate high-phasing quality.
    • The method exhibits robustness to varying projector defocus levels, confirmed by simulations and experiments.

    Conclusions:

    • The novel binary fringe generation method significantly improves structured light measurement quality.
    • The approach offers enhanced robustness against projector defocus, a key limitation of existing techniques.
    • This work provides a more reliable and accurate solution for 3D measurement applications.