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Efficient Perovskite Light-Emitting Diodes by Buried Interface Modification with Triphenylphosphine Oxide
Yaping Zhao1, Mingliang Li1,2, Xiangqian Qin1
1Xiamen Key Laboratory of Optoelectronic Materials and Advanced Manufacturing, Institute of Luminescent Materials and Information Displays, College of Materials Science and Engineering, Huaqiao University, Xiamen 361021, China.
Researchers improved perovskite light-emitting diode (LED) performance by passivating buried interface defects using triphenylphosphine oxide (TPPO). This method enhances film quality and device efficiency, achieving a 21.01% external quantum efficiency.
Area of Science:
- Materials Science
- Optoelectronics
- Chemistry
Background:
- Solution-processed metal halide perovskite films often suffer from interface defects, hindering perovskite light-emitting diode (LED) performance.
- Existing passivation strategies primarily target the top interface, neglecting the critical buried interface between the perovskite and charge transport layers.
Purpose of the Study:
- To investigate the efficacy of modifying the buried interface in perovskite LEDs using triphenylphosphine oxide (TPPO).
- To address interface defects and improve device performance and reproducibility.
Main Methods:
- Deposition of triphenylphosphine oxide (TPPO) molecules at the buried interface between the perovskite emitting layer and the hole transport layer (HTL).
- Characterization of film quality, interface properties, and device performance.
Main Results:
- TPPO deposition improved substrate wettability and film quality, reducing contact recombination.
- TPPO passivated uncoordinated lead (Pb2+) and halogen vacancy defects via P=O lone pair electron interaction.
- The insulating property of TPPO balanced charge injection, leading to enhanced device performance.
Conclusions:
- Buried interface modification with TPPO is an effective strategy for enhancing perovskite LED performance.
- Achieved a maximum external quantum efficiency (EQEmax) of 21.01% with improved device reproducibility (average 18.4 ± 0.9% over 30 devices).
- This approach offers a promising route for developing high-performance and reliable perovskite optoelectronic devices.

