Characterization of Magnetron Sputtered BiTe-Based Thermoelectric Thin Films

Area of Science:

• Materials Science
• Energy Conversion
• Nanotechnology

Background:

• Thermoelectric (TE) technology offers promising energy conversion capabilities.
• Thin-film TE materials enable flexible and miniature device development.
• Controlling microstructure and composition is key to enhancing TE power.

Purpose of the Study:

• To deposit and characterize N-type and P-type BiTe-based thin films.
• To investigate the impact of deposition parameters on TE properties.
• To optimize flexible TE devices for thermal energy harvesting.

Main Methods:

• Magnetron sputtering for thin-film deposition on silicon, glass, and Kapton.
• SEM/EDX, XRD, and TEM for morphology, microstructure, and phase analysis.
• In-plane advanced test system for electrical and thermal conductivity and Seebeck coefficient measurement.

Main Results:

• Characterization of BiTe-based thin films' morphology, microstructure, and phase.
• Measurement of electrical conductivity, thermal conductivity, and Seebeck coefficient.
• Evaluation of power output (open-circuit voltage and current) under temperature gradients.

Conclusions:

• Optimized deposition parameters and film dimensions are crucial for flexible TE devices.
• BiTe-based thin films show potential for efficient thermal energy harvesting.
• Further research can lead to advanced flexible and miniature TE devices.