Related Experiment Video
Updated: Aug 14, 2025

15:04
Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
7.5K
Self-Bayesian aberration removal via constraints for ultracold atom microscopy.
Emine Altuntaş1, I B Spielman1
1Joint Quantum Institute, National Institute of Standards and Technology, and University of Maryland, Gaithersburg, Maryland 20899, USA.
Summary
Researchers developed a digital method to correct aberrations in high-resolution microscopy of ultracold atoms. This technique uses a low-cost lens, enabling precise imaging for quantum gas microscopy without expensive custom optics.
Area of Science:
- Atomic, Molecular, and Optical (AMO) Physics
- Quantum Optics
- Microscopy
Background:
- High-resolution imaging of ultracold atoms, crucial for quantum gas microscopy, typically demands custom high numerical aperture (NA) optics.
- Existing high NA objectives often suffer from optical losses and light scattering, hindering quantum backaction-limited measurements.
Purpose of the Study:
- To present a cost-effective, hardware-independent methodology for digitally correcting aberrations in high-resolution microscopy of ultracold atoms.
- To demonstrate the recovery of nearly the full NA of a low-cost, aberrated objective lens.
Main Methods:
- Employing a low-cost, high NA aspheric lens for imaging 87Rb Bose-Einstein condensates.
- Utilizing density-density correlations measured with varying defocus to characterize even-order aberrations.
- Applying digital aberration correction to phase-contrast imaging data.
Main Results:
- Successful digital elimination of aberrations from a low-cost, high NA objective lens.
- Recovery of nearly the full NA, enabling high-resolution imaging of quantum objects.
- Demonstrated reduction of photon shot noise in density-density correlation measurements.
Conclusions:
- A simple, powerful digital aberration correction method enhances microscopy of quantum objects.
- This technique makes high-resolution imaging of ultracold atoms more accessible and economical.
- The digital correction is applicable to various imaging strategies, particularly dispersive techniques for weak measurements.
Related Concept Videos
Atomic Force Microscopy
3.5K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.5K
NMR Spectrometers: Resolution and Error Correction
749
When magnetic nuclei in a sample achieve resonance and undergo relaxation, the signal detected in NMR is an approximately exponential free induction decay. Fourier transform of an exponential decay yields a Lorentzian peak in the frequency domain. Lorentzian peaks in an NMR spectrum are defined by their amplitude, full width at half maximum, and position, where the peak width is governed by the spin-spin relaxation time alone. In real experiments, however, the applied magnetic field is rendered...
749

