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Temporal dynamics of charge buildup in cryo-electron microscopy
Makoto Tokoro Schreiber1, Alan Maigné1, Marco Beleggia2
1Molecular Cryo-Electron Microscopy Unit, Okinawa Institute of Science and Technology Graduate University, 1919-1 Tancha, Onna-son, Okinawa, Japan.
Journal of Structural Biology: X
|January 12, 2023
Summary
Electron beam exposure causes charge accumulation in insulating samples, impacting imaging. This study quantifies charge distribution and dynamics in vitreous ice, revealing dose-rate dependent effects on sample stability and image quality.
Area of Science:
- Electron microscopy
- Materials science
- Biophysics
Background:
- Insulating samples accumulate charge when exposed to electron beams.
- The impact of this charge accumulation on transmission electron microscopy (TEM) imaging parameters and sample stability is not well understood.
Purpose of the Study:
- To quantify the spatial distribution and temporal dynamics of charge accumulation in vitreous ice samples with embedded proteins.
- To understand how charge buildup affects imaging parameters and sample stability in TEM.
Main Methods:
- Combined modeling and Fresnel diffraction experiments.
- Investigated charge accumulation on vitreous ice samples with embedded proteins.
Main Results:
- Observed rapid evolution of charge state upon initial electron beam exposure.
- Identified charge gradients at ice-carbon film interfaces.
- Demonstrated dose-rate dependent ice film movement and charge variations affecting image defocus via height changes and lensing.
Conclusions:
- Charge accumulation dynamics are crucial for understanding electron beam effects on insulating samples.
- Results provide insights for optimizing sample preparation, data collection, and processing for dose-sensitive TEM imaging.
