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Updated: Aug 14, 2025

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Retrieving the phase of diffraction orders generated with tailored gratings
Abstract:
A technique is performed to quantitatively evaluate the intensity and phase of the diffraction orders generated by tailored phase gratings displayed onto a liquid-crystal spatial light modulator (LC-SLM). The SLM displays the grating together with a lens to obtain the Fourier transform. The setup is converted into a polarization common-path interferometer by simply rotating a polarizer. This configuration allows a phase-shifting interferometry algorithm to be applied to retrieve the phase of the diffraction orders. The quadratic phase arising in the system, which must be subtracted, is calibrated using triplicator gratings of varying periods. Various tailored designs with controlled phase shift between diffraction orders are experimentally tested to prove the advantage and simplicity of the technique.
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