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Elastic solution of surface loaded layer with couple and surface stress effects
Jintara Lawongkerd1, Toan Minh Le2, Wipavee Wongviboonsin2
1Department of Civil Engineering, Faculty of Engineering, Thammasat School of Engineering, Thammasat University, Pathumthani, 12120, Thailand.
This study presents an elastic solution for surface-loaded thin layers, considering surface stress and microstructural effects. The findings are crucial for understanding size-dependent mechanical responses in micro/nano-scale contact problems.
Area of Science:
- Solid Mechanics
- Materials Science
- Nanotechnology
Background:
- Traditional elastic solutions often neglect surface stress and microstructural effects.
- These effects become significant at the micro/nano scale, influencing material behavior.
- Contact mechanics at small scales requires advanced theoretical frameworks.
Purpose of the Study:
- To establish an elastic solution for axisymmetrically surface-loaded thin layers on a rigid substrate.
- To incorporate surface stress and material microstructural effects into the elastic solution.
- To investigate the size effects on mechanical response and provide fundamental solutions for micro/nano-scale contact problems.
Main Methods:
- Adoption of couple stress theory for the bulk layer and surface elasticity theory for the surface material.
- Utilizing the Hankel transform method to derive the general solution of the elastic field within the bulk layer.
- Integration of surface equations and boundary conditions to determine unknown constants.
Main Results:
- An elastic solution accounting for surface and couple stresses was successfully established.
- The derived solutions enable the investigation of size effects on mechanical responses.
- The study provides fundamental solutions applicable to micro/nano-scale contact mechanics.
Conclusions:
- Surface stress and couple stress significantly influence the load transfer mechanism to the substrate.
- The mechanical response exhibits size-dependent characteristics across various external and internal length scales.
- The developed solutions are essential for accurate modeling of micro/nano-scale contact phenomena.
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