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Updated: Aug 13, 2025

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
Chenglong Wang1, Guanghan Huang2, Zhiyuan Huang2
1School of Electronic Information and Electrical Engineering, Huizhou University, Huizhou 516007, Guangdong, China.
This study introduces conditional TransGAN (cTransGAN) to improve printed circuit board (PCB) inspection. The generative model enhances training data, boosting accuracy for component recognition and defect detection.
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