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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.5K

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Updated: Aug 13, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
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Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe.

Yongzhen Luo1, Xidong Ding2, Tianci Chen2

  • 1School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou 510275, China.

Micromachines
|January 21, 2023
PubMed
Summary

This study presents a new, affordable atomic force microscope (AFM) system using a quartz tuning fork (QTF) probe. The developed system achieves high-quality surface topography imaging in ambient conditions.

Keywords:
atomic force microscopeembedded controlfrequency modulationmeasurement and control systemquartz tuning forkself-inductive probe

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Instrumentation

Background:

  • Atomic Force Microscopy (AFM) is crucial for nanoscale surface analysis.
  • Existing AFM systems can be costly and complex.
  • Developing cost-effective and compatible AFM solutions is essential for broader accessibility.

Purpose of the Study:

  • To introduce a low-cost, expandable, and compatible AFM measurement and control system.
  • To integrate a quartz tuning fork (QTF) self-sensing probe with frequency modulation.
  • To enable high-quality surface topography imaging in an atmospheric environment.

Main Methods:

  • The system utilizes an embedded control unit with a dual-core microprocessor (DSP + ARM), high-precision ADCs/DACs, and a DDS.
  • A novel digital-analog hybrid lock-in amplifier (LIA) detects QTF probe signal frequency and phase.
  • A software-based frequency detection method with <3% relative error is implemented.

Main Results:

  • A self-sensing probe controller with automatic gain control (AGC) was designed for a balanced QTF probe.
  • Quality factors (Q values) of QTF probes with varying tungsten tip lengths were measured.
  • Successful AFM topography imaging was achieved using a 3 mm tungsten-tip QTF probe.

Conclusions:

  • The developed AFM system, leveraging QTF self-sensing probes, provides a viable low-cost solution.
  • The system demonstrates capability for high-quality surface topography scanning in atmospheric conditions.
  • This advancement can enhance the accessibility and application range of AFM technology.