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High-Speed Fully Differential Two-Step ADC Design Method for CMOS Image Sensor.

Zhongjie Guo¹, Yangle Wang¹, Ruiming Xu¹

¹Department of Electronic Engineering, Xi'an University of Technology, No. 5 Jinhua South Road, Xi'an 710054, China.

Sensors (Basel, Switzerland)

|January 21, 2023

Summary

This summary is machine-generated.

This study introduces a novel high-speed analog-to-digital converter (ADC) design for CMOS image sensors (CIS), overcoming speed limitations. The new method significantly boosts conversion speed, enabling high frame rate applications.

Keywords:

CMOS image sensor differential ramp level encoding time-to-digital conversion two-step

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Area of Science:

Electrical Engineering
Materials Science

Background:

Traditional analog-to-digital converters (ADCs) in CMOS image sensors (CIS) face speed limitations, hindering high frame rate applications.
Existing single-slope and serial two-step ADCs do not meet the demanding speed requirements of modern industrial CIS applications.

Purpose of the Study:

To propose a high-speed, fully differential two-step ADC design method for CMOS image sensors.
To address the speed limitations of traditional ADCs and enable high frame rate CIS applications.

Main Methods:

Developed a novel ADC design based on differential ramp and time-to-digital conversion (TDC) technology.
Implemented a parallel conversion mode and a level-coding-based TDC for improved performance.
Designed, laid out, and verified the circuit on a 55 nm 1P4M CMOS platform.

Main Results:

Achieved a 12-bit ADC with a conversion time of 480 ns at a 100 MHz clock frequency.
Demonstrated low power consumption (62 μW), excellent linearity (DNL ±0.6 LSB, INL +1.2/-1.4 LSB), and high SNDR (70.08 dB).
Achieved over 52% increase in conversion speed compared to advanced single-slope ADCs.

Conclusions:

The proposed differential ramp and level-coding TDC based two-step ADC offers an effective solution for high frame rate CIS.
This design enables large area arrays with high frame rates, meeting industrial application demands.
The method provides a significant advancement in ADC technology for high-performance image sensing.