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Methods for Reducing Subdivision Error within One Signal Period of Single-Field Scanning Absolute Linear Encoder.

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Researchers reduced subdivision error (SDE) in absolute linear encoders by 38% using novel Moiré fringe and phase shift methods. This improves positioning accuracy and low-velocity control in CNC machines.

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Area of Science:

  • Metrology
  • Optical Engineering
  • Control Systems

Background:

  • Absolute linear encoders are crucial for precise displacement measurement in advanced CNC machines.
  • Subdivision error (SDE) significantly impacts positioning accuracy and low-velocity control in these systems.

Purpose of the Study:

  • To investigate the working principle of absolute linear encoders.
  • To propose and validate methods for reducing SDE in absolute linear encoders.

Main Methods:

  • Developed a single-field scanning method utilizing shutter-shaped Moiré fringes.
  • Implemented a phase shift technique for index grating to suppress harmonics.
  • Established a dedicated SDE measuring device for constant-speed measurements.

Main Results:

  • Reduced SDE from ±0.218 μm to ±0.135 μm, a 38.07% improvement.
  • Fast Fourier Transform (FFT) analysis confirmed effective suppression of third-, fifth-, and seventh-order harmonics.
  • Validated the efficacy of the proposed methods in enhancing encoder performance.

Conclusions:

  • The proposed methods significantly reduce subdivision error in absolute linear encoders.
  • Improved SDE leads to enhanced positioning accuracy and better low-velocity control in CNC applications.
  • Harmonic suppression is key to achieving higher precision in optical encoder systems.