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A CMOS Image Readout Circuit with On-Chip Defective Pixel Detection and Correction
Bárbaro M López-Portilla1, Wladimir Valenzuela1, Payman Zarkesh-Ha2
1Electrical Engineering Department, University of Concepción, Edmundo Larenas 219, Concepción 4070386, Chile.
Sensors (Basel, Switzerland)
|January 21, 2023
Summary
This study introduces a new algorithm and CMOS circuit for detecting and correcting defective pixels in images. The method significantly improves image quality, outperforming existing techniques for real-time processing.
Area of Science:
- Image processing
- Analog circuit design
- Semiconductor device physics
Background:
- Defective pixels in CMOS image sensors degrade image quality.
- Early detection and correction are crucial for reliable image data.
Purpose of the Study:
- To propose and implement an efficient algorithm for defective pixel detection and correction.
- To integrate this solution at the pixel and column levels within CMOS image sensors.
Main Methods:
- Developed a CMOS analog circuit for parallel defective pixel detection using neighborhood arithmetic operations.
- Implemented a column-level circuit to replace defective pixels with median values.
- Designed and simulated a 128x128-pixel imager with integrated detection/correction circuits.
Main Results:
- Achieved high processing speeds of 694 frames per second.
- Demonstrated superior performance with Peak Signal to Noise Ratio (PSNR) of 45 dB and Image Enhancement Factor (IEF) of 198.4 for 0.5% defective pixels.
- Obtained PSNR of 44.4 dB and IEF of 194.2 for 1.0% defective pixels.
Conclusions:
- The proposed algorithm and CMOS implementation effectively detect and correct defective pixels.
- This integrated approach offers state-of-the-art performance for real-time image processing applications.
