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Characterization of Thermal Transport in One-dimensional Solid Materials
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Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using

Paul S Minson1, Felipe Rivera1, Richard Vanfleet1

  • 1Department of Physics and Astronomy, Brigham Young University, N283 Eyring Science Center, Provo, UT 84602, United States.

Ultramicroscopy
|January 23, 2023
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Summary

Scanning transmission electron microscopy (STEM) can now measure temperature at the nanoscale. This new method uses electron scattering to create a material-specific calibration curve, improving nanothermometry accuracy.

Keywords:
EELSNanothermometryQuantitativeSTEMTDSThermal diffuse scattering

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Area of Science:

  • Materials Science
  • Electron Microscopy
  • Nanotechnology

Background:

  • Scanning transmission electron microscopy (STEM) has seen renewed interest for quantitative analysis.
  • Using STEM as a nanothermometric probe is a promising application.
  • Challenges include achieving sensitivity for small signal changes and separating thermal effects from material properties.

Purpose of the Study:

  • To develop a method for sensitive and accurate nanothermometry using STEM.
  • To create a material-specific calibration curve for temperature measurements.
  • To decouple thermal scattering effects from specimen thickness and material variations.

Main Methods:

  • Developed a novel method combining STEM with electron energy loss spectroscopy (EELS).
  • Generated a material-specific calibration curve by measuring the HAADF signal across a temperature range (89 K to 294 K) on silicon.
  • Normalized the HAADF signal for beam intensity and specimen thickness.

Main Results:

  • A monotonically increasing HAADF signal (4.0% to 4.4% of direct beam) was observed on silicon at a thickness-to-mean-free-path ratio of 0.5.
  • A calibration curve of temperature versus normalized HAADF signal was successfully produced.
  • Demonstrated potential for testing electron scattering models by measuring silicon's mean atomic vibration amplitude (0.00738 ± 0.00002 nm at 294 K).

Conclusions:

  • The developed STEM-EELS method enables accurate nanothermometry with high spatial resolution.
  • The technique effectively calibrates temperature measurements, accounting for specimen variations.
  • Validated electron scattering models and provided precise measurements of atomic vibration amplitudes.