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High-resolution x-ray spectrometer for x-ray absorption fine structure spectroscopy.

D A Chin1, P M Nilson2, D Mastrosimone2

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New spectrometers enable high-resolution X-ray absorption fine structure (XAFS) spectroscopy. These instruments offer precise energy calibration, improving measurements of material electronic structures and metal alloys.

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Area of Science:

  • Materials Science
  • Atomic and Molecular Physics
  • Spectroscopy

Background:

  • High-resolution X-ray spectroscopy is crucial for material characterization.
  • Existing techniques often lack precise energy calibration and broad energy range.
  • Advancements are needed for detailed electronic structure analysis.

Purpose of the Study:

  • To design and build novel extended X-ray absorption fine structure flat crystal spectrometers (EFX).
  • To achieve high-resolution XAFS spectroscopy with flexible, on-shot energy calibration.
  • To enhance the capabilities of existing experimental platforms like the OMEGA-60 XAFS system.

Main Methods:

  • Utilized flat silicon [111] crystals in reflection geometry for energy dispersion.
  • Implemented a shot-to-shot configurable calibration filter pack.
  • Employed a Bayesian inference routine for precise energy dispersion relation constraints.

Main Results:

  • Achieved spectral resolution of 4.5 eV with a 50 μm source size at 7.2 keV.
  • Constrained the energy dispersion relation to within ±3 eV.
  • EFX spectrometers cover an energy range of 6.3–11.4 keV.

Conclusions:

  • The developed EFX spectrometers offer significant improvements for XAFS spectroscopy.
  • Enabled simultaneous extended XAFS measurements of multiple absorption edges in metal alloys.
  • Facilitated X-ray absorption near-edge spectroscopy for studying compressed 3d transition metals.