Feedback lock-in: A versatile multi-terminal measurement system for electrical transport devices

Arthur W Barnard1, Evgeny Mikheev1, Joe Finney1

  • 1Department of Physics, Stanford University, Stanford, California 94305, USA.

Summary

We developed a feedback lock-in system for precise, parallel electrical measurements on multi-terminal devices. This innovative system enhances sensitivity and enables new measurement techniques for materials like graphene.

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