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Feedback lock-in: A versatile multi-terminal measurement system for electrical transport devices
Arthur W Barnard1, Evgeny Mikheev1, Joe Finney1
1Department of Physics, Stanford University, Stanford, California 94305, USA.
We developed a feedback lock-in system for precise, parallel electrical measurements on multi-terminal devices. This innovative system enhances sensitivity and enables new measurement techniques for materials like graphene.
Area of Science:
- Materials Science
- Electrical Engineering
- Condensed Matter Physics
Background:
- Accurate measurement of small currents and voltages is crucial for characterizing multi-terminal electronic devices.
- Traditional methods often require complex setups and lack flexibility for dynamic configuration switching.
Purpose of the Study:
- To design and implement a versatile measurement system for parallel electrical characterization.
- To enable software-controlled dynamic configuration of measurement probes.
- To achieve high-sensitivity measurements without specialized current preamplifiers.
Main Methods:
- Development of a feedback lock-in system integrating digital feedback control and software-defined lock-in measurements.
- Utilizing commercially available digital I/O boards, custom voltage preamplifiers, and open-source software.
- Software control of probe input impedance to function as voltage or current leads.
Main Results:
- Demonstrated differential measurement sensitivity comparable to commercial lock-in amplifiers.
- Successfully performed efficient multi-terminal electrical transport measurements on twisted bilayer graphene and SrTiO3 quantum point contacts.
- Enabled a novel measurement approach using multiple current probes on a ballistic graphene device.
Conclusions:
- The feedback lock-in system offers a flexible and sensitive platform for advanced electrical characterization.
- The system's adaptability facilitates efficient measurements on complex quantum materials.
- The developed technology opens avenues for new experimental methodologies in electronic transport studies.
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