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Printable Epsilon-Type Structure Transistor Arrays with Highly Reliable Physical Unclonable Functions.

Rui Wang1, Kun Liang2, Saisai Wang3

  • 1Key Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi'an, 710071, China.

Advanced Materials (Deerfield Beach, Fla.)
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Summary

Researchers developed high-reliability physical unclonable functions (PUFs) using printable epsilon-type indium tin oxide transistor arrays. These novel PUFs enhance security for data-intensive printed electronics and resist machine-learning attacks.

Keywords:
coffee-ring effecthardware securitymetal-oxide transistorsphysical unclonable functionsprinted electronics

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Area of Science:

  • Electronics
  • Materials Science
  • Cybersecurity

Background:

  • Printed electronics enable low-cost, large-area fabrication of devices on unconventional substrates.
  • Secure communication and authentication are crucial for data-intensive printed electronic technologies.
  • Physical unclonable functions (PUFs) offer hardware security by leveraging device-specific manufacturing variations.

Purpose of the Study:

  • To develop high-reliability PUFs for printed electronics.
  • To enhance the robustness of printed PUFs against environmental noise.
  • To investigate novel structures for improved PUF performance.

Main Methods:

  • Fabrication of printable epsilon-type indium tin oxide transistor arrays.
  • Modification of the coffee-ring structure to enhance printing uncertainty.
  • Utilizing print-induced variations in channel thickness and length for PUF construction.

Main Results:

  • The epsilon-type structure improved printing scalability, film quality, and device reliability.
  • Print-induced uncertainty in channel dimensions significantly increased.
  • The developed PUFs demonstrated near-ideal uniformity, uniqueness, randomness, and reliability.
  • PUFs showed resilience against machine-learning attacks with low prediction accuracy (55% without postprocessing).

Conclusions:

  • Printable epsilon-type transistor arrays with modified coffee-ring structures are effective for creating high-reliability PUFs.
  • This approach addresses the challenge of robustness in printed PUFs.
  • The developed PUFs offer a promising solution for secure hardware in printed electronics.