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Updated: Aug 11, 2025

Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
Published on: June 23, 2023
Technology for Fundamental Improvement of an Extremely Low-Quality Video Signal for Use in Fine Focusing and
Eisaku Oho1, Sadao Yamazaki1, Kazuhiko Suzuki2
1Department of Electrical and Electronic Engineering, Faculty of Engineering, Kogakuin University, 2665-1 Nakano-machi, Hachioji, Tokyo 192-0015, Japan.
Abstract:
This study describes important techniques for production of a series of video signals for use in fine focusing operations and near-perfect astigmatism correction in the general-purpose scanning electron microscopy (SEM) field. These techniques can enhance the stability of the signal greatly when used for focusing. As two particularly important fundamental techniques, SEM image acquisition with priority given to the signal-to-noise ratio and signal reinforcement based on the active image processing concept were utilized fully. The performance improvement was evaluated using the case of a previously reported support system for fine focusing and astigmatism correction based on image covariance. The method is almost completely robust against noise within practical limits and allows for focusing and astigmatism correction for even extremely noisy SEM images. The results of this study may be useful not only in the SEM field but also in many fields that use weak signals.
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