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Direct Measurement of Negative Capacitance in Ferroelectric/Semiconductor Heterostructures

Lin Liu1, Lin Lei1, Xiaomei Lu1,2

  • 1National Laboratory of Solid State Microstructures and Physics School, Nanjing University, Nanjing 210093, China.

ACS Applied Materials & Interfaces
|February 8, 2023
PubMed
Abstract

Keywords:
charge injectionferroelectric/semiconductor heterostructuresinterfacesnegative capacitanceoxygen vacancy migration

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