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Estimation of process performance index for the two-parameter exponential distribution with measurement error
Yi Li1, Jyun-You Chiang1, Yajie Bai1
1School of Statistics, Southwestern University of Finance and Economics, Chengdu, 611130, China.
This study introduces a new method to estimate process performance indices accounting for measurement errors in two-parameter exponential distributions. The proposed method improves accuracy and reliability in performance assessment.
Area of Science:
- Industrial Engineering
- Statistical Quality Control
- Metrology
Background:
- Existing process performance indices do not account for inevitable measurement errors.
- This limitation affects the accuracy of process performance assessment in real-world applications.
- A robust estimation method is needed to address these inaccuracies.
Purpose of the Study:
- To propose an estimation method for process performance index in two-parameter exponential distributions considering measurement errors.
- To fill the gap in current methodologies by incorporating a full error model.
- To provide a more accurate and reliable assessment of process performance.
Main Methods:
- Utilized a full error model to describe the relationship between actual and measured values.
- Employed the maximum likelihood estimation method to determine unknown parameters.
- Applied the Bootstrap method for constructing confidence intervals of the process performance index.
Main Results:
- The proposed estimator was evaluated based on bias, mean square error (MSE), and average interval length.
- Simulation results demonstrated that the new estimator surpasses existing methods in performance.
- The method was illustrated using mileage data from military personnel carriers.
Conclusions:
- The developed estimation method effectively incorporates measurement errors into process performance index calculations.
- The proposed approach offers superior accuracy and reliability compared to traditional methods.
- This research provides a valuable tool for quality control and process improvement in the presence of measurement uncertainty.
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