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Phase Deflectometry for Defect Detection of High Reflection Objects.

Xian-Ming Cheng1, Ting-Ting Wang1, Wen-Bin Zhu1

  • 1College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China.

Sensors (Basel, Switzerland)
|February 11, 2023
PubMed
Summary
This summary is machine-generated.

This study introduces a novel method for detecting surface defects on highly reflective objects by analyzing phase deflection. The technique accurately identifies defects by measuring changes in surface gradients and fringe phase, overcoming periodic errors.

Keywords:
double surfacephase deflectionsurface gradients

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Area of Science:

  • Optical Metrology
  • Surface Inspection
  • Non-Destructive Testing

Background:

  • Detecting surface defects on high-reflection objects is challenging due to specular reflections.
  • Traditional methods often struggle with accuracy and sensitivity for such surfaces.
  • Phase-based optical techniques offer potential for high-precision surface analysis.

Purpose of the Study:

  • To propose and validate a new method for detecting surface defects on high-reflection objects.
  • To utilize phase deflection principles for accurate defect characterization.
  • To address and mitigate common sources of error in phase-based measurements.

Main Methods:

  • Employing Gray code combined with a four-step phase-shift method to determine surface gradients.
  • Developing a double surface illumination model to correlate illumination intensity with phase.
  • Analyzing the causes of periodic error interference and proposing fringe width adjustment for elimination.

Main Results:

  • The proposed method successfully obtains surface gradients, enabling defect characterization.
  • A clear relationship between illumination intensity and phase was established.
  • Periodic error interference was identified and effectively eliminated by adjusting fringe width.
  • Experimental results confirmed the method's effectiveness in detecting surface defects.

Conclusions:

  • The developed phase deflection method is effective for detecting surface defects on high-reflection objects.
  • The combination of Gray code, phase-shifting, and a specific illumination model provides accurate defect detection.
  • The proposed error elimination strategy enhances the reliability of the measurement technique.