Related Experiment Video
Updated: Aug 10, 2025

Automation of Mode Locking in a Nonlinear Polarization Rotation Fiber Laser through Output Polarization Measurements
Published on: February 28, 2016
Leader-laggard synchronization of polarization chaos in mutually coupled free-running VCSELs
Abstract:
We systematically study the leader-laggard synchronization of polarization chaos in mutually coupled free-running vertical cavity surface emitting semiconductor lasers in two cases of parallel and orthogonal injection. Specifically, we quantitatively investigate the effect of critical external parameter mismatch such as the coupling intensity and frequency detuning on the leader-laggard relationship utilizing the cross-correlation function. When the difference between two main cross-correlation peak values exceeds 0.1, the leader-laggard relationship can be viewed to be stable. Our results demonstrate that compared with the coupling strength, the frequency detuning is the dominant factor in determining the stability of the leader-laggard relationship. The exchange of the leader-laggard role occurs within a frequency detuning region from -5 GHz to 5 GHz for both parallel and orthogonal injection. Once the leader-laggard relationship is stable, the difference between the two cross-correlation values can reach 0.242 for negative frequency detuning, but the corresponding value is only 0.146 under positive frequency detuning.
Related Concept Videos
Dielectric Polarization in a Capacitor
Oscillations In An LC Circuit
Biasing of P-N Junction
In equilibrium, no external voltage is applied across the p-n junction. The depletion region is formed at the junction interface due to the diffusion of carriers, which leaves behind charged dopants, acceptors on the p-side, and donors on the n-side. These immobile charges create an electric field that prevents further diffusion of carriers. The related energy band...
Group Polarization
Biasing of Metal-Semiconductor Junctions
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
Biasing of FET
In an N-channel JFET, the structure consists of N-type material forming the channel on a P-type substrate, with the...

