A multi-task and multi-channel convolutional neural network for semi-supervised neonatal artefact detection

Tim Hermans1, Laura Smets1,2, Katrien Lemmens3,4

  • 1Department of Electrical Engineering (ESAT), STADIUS Center for Dynamical Systems, Signal Processing and Data Analytics, KU Leuven, Leuven, Belgium.

Summary

This study introduces a semi-supervised deep learning method for detecting artefacts in neonatal electroencephalogram (EEG) data, significantly improving accuracy with limited labelled data for better automated analysis.

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