Correction: Interfacial engineering of a Mo/Hf0.3Zr0.7O2/Si capacitor using the direct scavenging effect of a thin Ti layer
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Updated: Aug 9, 2025

Fabrication of Low Temperature Carbon Nanotube Vertical Interconnects Compatible with Semiconductor Technology
Published on: December 7, 2015
Se Hyun Kim1, Geun Taek Yu1, Geun Hyeong Park1
1School of Materials Science and Engineering, Pusan National University, Busan 46241, Republic of Korea. jilee@pnu.ac.kr.
Abstract:
Correction for 'Interfacial engineering of a Mo/Hf0.3Zr0.7O2/Si capacitor using the direct scavenging effect of a thin Ti layer' by Se Hyun Kim et al., Chem. Commun., 2021, 57, 12452-12455, https://doi.org/10.1039/D1CC04966F.
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