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Updated: Aug 9, 2025

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
Published on: July 27, 2018
Haoqiang Yan1, Dayu Li1, Wei Xu2,3
1College of Computer Science and Engineering, Northeastern University, Shenyang, 110819, China. lidayu@mail.neu.edu.cn.
A new image current splicing method enhances mass analysis resolution in ion traps by combining the filter diagonalization method (FDM) and Hilbert transform. This technique overcomes high buffer gas pressure limitations, significantly improving mass resolution for detailed ion analysis.
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