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Related Experiment Video

Updated: Aug 9, 2025

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Large-scale calibration method for MEMS-based projector 3D reconstruction.

Tinglei Wan, Yuhang Liu, Yangfan Zhou

    Optics Express
    |February 24, 2023
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces an efficient calibration method for uniaxial Micro-Electro-Mechanical System (MEMS) projectors, improving large-scale 3D reconstruction accuracy. The novel approach ensures high precision even in expansive environments with minimal data.

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    Area of Science:

    • Optics and Photonics
    • Robotics and Automation
    • Computer Vision

    Background:

    • Micro-Electro-Mechanical System (MEMS) projectors offer compact size and low cost.
    • Uniaxial MEMS projectors are valuable for high-accuracy structured light 3D reconstruction.
    • Existing calibration methods are insufficient for large-scale MEMS projector applications.

    Purpose of the Study:

    • To develop a novel, efficient, and easily implemented large-scale calibration method for uniaxial MEMS projectors.
    • To address the limitations of current calibration techniques in extensive 3D reconstruction scenarios.

    Main Methods:

    • Calibrates a partial light plane using a fixed sampling period.
    • Employs non-fixed rotating shaft linear interpolation to determine the remaining light plane.
    • Validates accuracy and efficiency with minimal calibration data sets.

    Main Results:

    • Achieves high accuracy in large depth-of-field applications with only 11 data sets.
    • Demonstrates a plane fitting error standard deviation of 0.2584mm at 3000mm on a standard plane.
    • Reports a measurement accuracy of 0.9124mm on a standard step object with a 200mm interval.

    Conclusions:

    • The proposed method offers a significant improvement for large-scale 3D reconstruction using uniaxial MEMS projectors.
    • The technique is both accurate and efficient, requiring limited calibration data.
    • This advancement facilitates broader applications of MEMS projectors in large-scale metrology and imaging.