Structural Classification of Joints
Biasing of Metal-Semiconductor Junctions
Difference from Background: Limit of Detection
Mismatch Repair
Functional Classification of Joints
Detection of Gross Error: The Q Test
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Aug 9, 2025

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
Jing Zhou1, Guang Li1, Ruifeng Wang1
1College of Biological Sciences and Medical Engineering, Southeast University, Nanjing 210096, China.
This study introduces a contrastive self-supervised learning (CSSL) framework to detect defects in chip solder joints. The method achieves 99.14% accuracy, enabling real-time quality control for printed circuit boards (PCBs).
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: