Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international

Tianjia Bu1, Huifang Gao1, Yaxuan Yao1

  • 1Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, National Institute of Metrology (NIM), Beijing, 100029, People's Republic of China.

Nanotechnology
|February 27, 2023
PubMed