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Updated: Aug 8, 2025

Control of Cell Adhesion using Hydrogel Patterning Techniques for Applications in Traction Force Microscopy
Published on: January 29, 2022
Qian Wang1, Xiaoyan Chen1, Di Wang1
1School of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin 300457, China.
This study introduces the Regularization Solver Guided Fast Iterative Shrinkage Threshold Algorithm (RS-FISTA) for electrical impedance tomography (EIT) reconstruction. RS-FISTA improves image quality and achieves faster convergence compared to existing methods.
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