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MAUD Rietveld Refinement Software for Neutron Diffraction Texture Studies of Single‑ and Dual‑Phase Materials
Alec I Saville1, Adam Creuziger2, Emily B Mitchell1
1Colorado School of Mines, Golden, CO, USA.
This study demonstrates using MAUD software for crystallographic texture analysis of materials, addressing common challenges in Rietveld refinement for neutron diffraction and electron backscatter diffraction data.
Area of Science:
- Materials Science and Engineering
- Crystallography
- Computational Materials Science
Background:
- Crystallographic texture analysis is crucial for understanding material properties.
- Rietveld refinement software, like MAUD, is widely used but presents operational challenges.
- Standardized procedures for texture analysis using MAUD are needed for consistent results.
Purpose of the Study:
- To provide a detailed instructional demonstration of MAUD for crystallographic texture evaluation.
- To address and resolve common challenges encountered during Rietveld refinement with MAUD.
- To establish a consistent and reliable refinement process applicable to various material systems and diffraction data.
Main Methods:
- Utilized MAUD software for Rietveld refinement of crystallographic texture.
- Applied the methodology to High-Pressure-Preferred-Orientation (HIPPO) neutron diffraction data.
- Incorporated electron backscatter diffraction (EBSD) pole figures for validation, specifically on Ti-6Al-4V additive manufactured samples.
Main Results:
- Developed a systematic evaluation of MAUD refinement steps, identifying and explaining potential user issues.
- Proposed a multilayered assessment for determining the completion of a MAUD refinement procedure.
- Highlighted the importance of appropriate sample symmetries in texture data interpretation.
Conclusions:
- The presented work offers a robust and systematic approach to crystallographic texture analysis using MAUD.
- Addressing software-specific challenges enhances user experience and data reliability.
- The findings contribute to more accurate and consistent material texture characterization from diffraction data.
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