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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Quantitative and Qualitative Examination of Particle-particle Interactions Using Colloidal Probe Nanoscopy
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Precise quantification of nanoparticle surface free energy via colloidal probe atomic force microscopy.

Pejman Ganjeh-Anzabi1, Heidi Jahandideh1, Stephanie A Kedzior1

  • 1Department of Chemical and Petroleum Engineering, University of Calgary, 2500 University Drive NW, Calgary, Alberta T2N 1N4, Canada.

Journal of Colloid and Interface Science
|March 20, 2023
PubMed
Summary

This study presents a new method using colloidal probe atomic force microscopy (CP-AFM) to accurately measure the surface free energy (SFE) of nanoparticles. This approach accounts for surface roughness, enabling reliable SFE determination for heterogeneous nanoparticle surfaces.

Keywords:
Colloidal probe atomic force microscopyContact mechanicsGraphene surface free energyInterfacial interactionsNanoparticlesSurface free energy

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Area of Science:

  • Colloid and Surface Science
  • Nanomaterials Characterization
  • Physical Chemistry

Background:

  • Interfacial interactions in colloids are governed by nanoparticle surface free energy (SFE).
  • Measuring SFE for nanoparticles is challenging due to their inherent surface heterogeneity and roughness.
  • Conventional methods like CP-AFM are unreliable for rough NP surfaces.

Purpose of the Study:

  • To develop a reliable method for determining the SFE of nanoparticles with heterogeneous surfaces.
  • To adapt CP-AFM measurements to account for surface roughness effects.
  • To quantify SFE for various nanoparticle materials.

Main Methods:

  • Adoption of Persson's contact theory to incorporate surface roughness into CP-AFM measurements.
  • Direct force measurements using CP-AFM.
  • SFE determination for polystyrene, silica, graphene oxide, and reduced graphene oxide nanoparticles.

Main Results:

  • A reliable approach to determine SFE of nanoparticles was developed by including surface roughness effects in CP-AFM.
  • SFE values were successfully obtained for materials with varying surface roughness and chemistry.
  • The method's reliability was validated using polystyrene nanoparticles.

Conclusions:

  • The adapted CP-AFM method provides robust and reliable SFE determination for rough and heterogeneous nanoparticle surfaces.
  • This technique overcomes limitations of conventional methods for nanoparticle SFE measurement.
  • Enables accurate characterization of interfacial nanoparticle behavior in colloidal systems.