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Timing resolution in double-sided silicon photon-counting computed tomography detectors.

Christel Sundberg1,2, Mats Persson1,3, J Jacob Wikner2,4

  • 1KTH Royal Institute of Technology, Department of Physics, Stockholm, Sweden.

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Summary

Achieving 1 ns timing resolution in silicon strip detectors for photon-counting spectral CT is possible. This advancement can improve signal-to-noise and energy resolution by identifying scattered photons.

Keywords:
coincidence detectioncomputed tomographyphoton-countingsilicon detectortiming resolution

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Area of Science:

  • Medical Imaging Physics
  • Semiconductor Detector Technology

Background:

  • Current photon-counting spectral computed tomography (CT) systems do not measure the precise timing of individual X-ray detections.
  • Precise timing information is crucial for advanced image reconstruction and improving data quality in future CT applications.

Purpose of the Study:

  • To investigate the achievable timing resolution in edge-on silicon strip detectors for photon-counting spectral CT.
  • To evaluate the potential of timing information for enhancing CT image reconstruction and data analysis.

Main Methods:

  • Utilized Monte Carlo simulations of photon interactions within silicon strip detectors.
  • Incorporated a charge transport model to simulate signal generation and processing.
  • Assessed performance using double-sided readout electronics and considering pixel size and wafer thickness.

Main Results:

  • Simulations indicate a potential time resolution of 1 nanosecond (ns) at a noise level of 0.5 keV.
  • Without electronic noise, the theoretical time resolution is significantly improved.

Conclusions:

  • Edge-on silicon strip detectors offer promising timing resolution for photon-counting spectral CT.
  • Accurate timing can enhance signal-to-noise ratio and energy resolution by enabling identification of Compton scattered photons.