You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Aug 5, 2025

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Xiang Cheng1,2,3, Shun Xu1,2,3, Yan Liu4
1School of Aerospace Engineering, Xiamen University, Xiamen 361005, China.
This study introduces a novel optoelectronic sensor to correct phase errors in micro-electro-mechanical system (MEMS) scanning micromirrors. The sensor significantly improves the accuracy of active structured light systems by reducing phase errors to 2.5%.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: