Improvement of Electromagnetic Side-Channel Information Measurement Platform

Shih-Yi Yuan1, Wei-Sheng Liu1

  • 1Department of Communication Engineering, Feng Chia University, Taichung 40724, Taiwan.

Summary

A new platform enhances electromagnetic radiation (EMR) measurement for microcontrollers (MCUs) and FPGAs, improving pattern recognition accuracy for embedded system security. This advancement aids in identifying instruction-based EMR signatures for better system-level security verification.