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Improvement of Electromagnetic Side-Channel Information Measurement Platform
1Department of Communication Engineering, Feng Chia University, Taichung 40724, Taiwan.
Sensors (Basel, Switzerland)
|March 30, 2023
Summary
A new platform enhances electromagnetic radiation (EMR) measurement for microcontrollers (MCUs) and FPGAs, improving pattern recognition accuracy for embedded system security. This advancement aids in identifying instruction-based EMR signatures for better system-level security verification.
Area of Science:
- Cybersecurity
- Embedded Systems
- Signal Processing
Background:
- Microcontroller (MCU) power-up electromagnetic radiation (EMR) patterns vary with executed instructions, posing a security risk for embedded systems and IoT devices.
- Current EMR pattern recognition accuracy is insufficient for robust security analysis.
- Understanding the relationship between EMR patterns and embedded system security is crucial.
Purpose of the Study:
- To propose and evaluate a novel platform designed to enhance EMR measurement and pattern recognition for embedded systems.
- To improve hardware-software interaction, automation, sampling rates, and reduce alignment issues in EMR data acquisition.
- To validate the platform's effectiveness on both microcontrollers (MCUs) and Field-Programmable Gate Array intellectual properties (FPGA-IPs).
Main Methods:
- Development of an integrated platform for seamless hardware-software interaction and automated EMR data acquisition.
- Implementation of higher sampling rates and precise positional alignment for improved measurement fidelity.
- Testing the platform with a microcontroller (MCU) and an FPGA-IP, utilizing similar neural network (NN) architectures for analysis.
Main Results:
- The new platform demonstrated improved top-1 EMR identification accuracy for the tested MCU compared to previous methods.
- Achieved the first known EMR identification for an FPGA-IP, showcasing the platform's broader applicability.
- The proposed platform facilitates EMR pattern measurement for neural network (NN) analysis across diverse embedded architectures.
Conclusions:
- The developed platform significantly enhances EMR measurement capabilities, leading to higher accuracy in identifying instruction-based EMR patterns.
- The platform's flexibility extends its utility from simple MCUs to complex FPGA-IPs, enabling system-level security verification.
- This research contributes to a deeper understanding of EMR pattern recognition for advancing embedded system security.
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