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Measurement of Ultrafast Vibrational Coherences in Polyatomic Radical Cations with Strong-Field Adiabatic Ionization
Published on: August 6, 2018
A simple retarding-potential time-of-flight mass spectrometer for electrospray propulsion diagnostics
Christopher T Lyne1, Miron F Liu1, Joshua L Rovey1
1Department of Aerospace Engineering, University of Illinois Urbana-Champaign, Urbana, IL 61801 USA.
Abstract:
The time-of-flight mass spectrometer (ToF-MS) is a useful tool for quantifying the performance of electrospray thrusters and characterizing their plumes. ToF-MS data can be used to calculate the mass-to-charge distribution in the plume, but the kinetic-energy-to-charge (i.e., the potential) distribution must be known first. Here we use a ToF-MS in tandem with a retarding potential (RP) analyzer. By sweeping the retarding potential through the range of potentials present in the plume, both the mass-to-charge distribution and the potential distribution can be measured independently. We demonstrate this technique in a case study using a capillary electrospray emitter and the ionic liquid propellant 1-Ethyl-3-methylimidazolium bis(trifluoromethylsulfonyl)imide, abbreviated EMI-Im. We report a linear correlation between retarding potential and mass-to-charge ratio that agrees with published data from more complex orthogonal RP/ToF-MS instruments. Calculated values for the jet velocity and jet breakup potential match within 2% and 12%, respectively. Using conventional ToF-MS, we estimated the propellant flow rate and compared those estimates to direct flow rate measurements. For flow rates between 233 pL/s and 565 pL/s, the error in ToF-based flow rate estimates ranged from -16% to -13% when the plume potential was assumed to be a function of mass-to-charge. Assuming a constant plume potential yielded mixed results. However, using the average stopping potential measured by a retarding potential analyzer resulted in higher errors, ranging from -26% to -30%. Data and MATLAB code are included as supplemental materials so that readers can easily apply the techniques described here.
Supplementary Information:
The online version contains supplementary material available at 10.1007/s44205-023-00045-y.
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