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Updated: Aug 3, 2025

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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
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Expression of Concern: Colossal Density-Driven Resistance Response in the Negative Charge Transfer Insulator MnS_{2}
1American Physical Society.
Physical Review Letters
|April 7, 2023
Abstract:
This corrects the article DOI: 10.1103/PhysRevLett.127.016401.
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