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592
Efficient Reflectance Capture With a Deep Gated Mixture-of-Experts
IEEE Transactions on Visualization and Computer Graphics
|April 8, 2023
Summary
This study introduces a new deep learning method for capturing material properties (anisotropic reflectance) more accurately and with fewer images. The framework uses specialized networks to improve reconstruction quality for various materials.
Area of Science:
- Computer Vision
- Computer Graphics
- Material Science
Background:
- Accurate material property acquisition is crucial for realistic rendering and analysis.
- Existing methods often require numerous input images or lack adaptability to diverse materials.
- Unified deep learning models may sacrifice quality for generality.
Purpose of the Study:
- To develop an efficient framework for pixel-independent anisotropic reflectance acquisition.
- To enhance reconstruction quality by conditioning network behavior on input photometric measurements.
- To reduce the number of required input images for high-quality reflectance reconstruction.
Main Methods:
- A deep gated mixture-of-experts framework was designed.
- A gating module selects specialized decoders based on photometric measurements.
- Illumination conditions during acquisition were jointly optimized.
- The framework was extended to handle non-planar reflectance scanning.
Main Results:
- The proposed method achieves improved quality compared to state-of-the-art techniques using the same number of input images.
- The number of input images can be reduced by approximately two-thirds for comparable results.
- The framework demonstrates effectiveness on various challenging near-planar samples using a lightstage.
- Generalization to enhance non-planar reflectance scanning was shown.
Conclusions:
- The novel gated mixture-of-experts approach enables efficient and high-quality anisotropic reflectance acquisition.
- The input-adaptive nature of the network leads to superior reconstruction performance.
- This framework offers a significant improvement in terms of quality and data efficiency for reflectance scanning.

