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Epitaxial Growth of Perovskite Strontium Titanate on Germanium via Atomic Layer Deposition
Published on: July 26, 2016
Thermo-desorption measurements during N-doped Ge-rich Ge2Sb2Te5crystallization
J Remondina1, A Portavoce1, M Bertoglio1
1Aix-Marseille University/CNRS, IM2NP, Faculté des Sciences de Saint-Jérôme case 142, F-13397 Marseille, France.
Nitrogen-doped Germanium-Antimony-Tellurium (N-doped GST) films, crucial for phase change memory, release gases like Ar and N2 during annealing. This indicates that the protective TiN layer does not fully prevent nitrogen loss, affecting material composition.
Area of Science:
- Materials Science
- Solid-state Chemistry
- Semiconductor Physics
Background:
- Germanium-Antimony-Tellurium (Ge2Sb2Te5 or GST) is a key material for phase change memory devices.
- Encapsulation with TiN or SiN layers and doping (N, C, O, Bi) are common strategies to stabilize GST properties and prevent oxidation.
- Controlling crystallization temperature and material composition during fabrication and operation is critical for device reliability.
Purpose of the Study:
- To investigate the desorption behavior of a nitrogen-doped GST (N-doped GGST) film encapsulated with a TiN layer during thermal annealing.
- To determine the chemical species desorbing from the N-doped GGST film and their correlation with the crystallization process.
- To assess the effectiveness of the TiN encapsulation layer in preventing the loss of dopant atoms.
Main Methods:
- Ultrahigh vacuum thermal desorption spectroscopy (TDS) was employed to analyze desorbing species.
- Isochronal annealing was performed on a N-doped GGST film covered by a 10 nm-thick TiN layer.
- In situ X-ray diffraction (XRD) measurements were used to monitor the crystallization state of the GGST film.
Main Results:
- Desorption of species including Ar, N2, H2, and H was observed.
- The primary desorption peak occurred between 653 K and 703 K, after the full crystallization of the GGST film.
- Comparison of TDS and XRD data revealed that the TiN layer did not completely prevent nitrogen atoms from leaving the GGST film during annealing.
Conclusions:
- The TiN encapsulation layer is not fully effective in preventing the out-diffusion of nitrogen from N-doped GGST films during thermal annealing.
- The observed desorption suggests a progressive change in the chemical composition of the N-doped GGST film during annealing and crystallization.
- These findings have implications for the thermal stability and long-term reliability of phase change memory devices based on N-doped GGST.
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