Related Experiment Video

Updated: Jul 13, 2026

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

Correction: Lu et al. Performance Analysis of Metalenses Based on Three Kinds of Phase Compensation Techniques.

Peiyao Lu1, Changda Zhou1, Zhen Mou1

  • 1Shandong Provincial Engineering and Technical Center of Light Manipulations & Shandong Provincial Key Laboratory of Optics and Photonic Device, School of Physics and Electronics, Shandong Normal University, Jinan 250014, China.

Nanomaterials (Basel, Switzerland)
|April 13, 2023
PubMed

More Related Videos

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces09:33

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces

Published on: June 7, 2019

Correction of Presbyopia by Monocular Bi-Aspheric Ablation Profile05:46

Correction of Presbyopia by Monocular Bi-Aspheric Ablation Profile

Published on: September 20, 2024

Related Concept Videos

Biasing of Metal-Semiconductor Junctions01:27

Biasing of Metal-Semiconductor Junctions

Biasing metal-semiconductor junctions involves applying a voltage across the junction. Specifically, the metal is connected to a voltage source, while the semiconductor is grounded. This technique is essential for controlling the direction and magnitude of current flow in electronic devices, including diodes, transistors, and photovoltaic cells.
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...