LeafSpec-Dicot: An Accurate and Portable Hyperspectral Imaging Device for Dicot Leaves

Soybean is one of the world's most consumed crops. As the human population continuously increases, new phenotyping technology is needed to develop new soybean varieties with high-yield, stress-tolerant, and disease-tolerant traits. Hyperspectral imaging (HSI) is one of the most used technologies for phenotyping. The current HSI techniques with indoor imaging towers and unmanned aerial vehicles (UAVs) suffer from multiple major noise sources, such as changes in ambient lighting conditions, leaf slopes, and environmental conditions. To reduce the noise, a portable single-leaf high-resolution HSI imager named LeafSpec was developed. However, the original design does not work efficiently for the size and shape of dicot leaves, such as soybean leaves. In addition, there is a potential to make the dicot leaf scanning much faster and easier by automating the manual scan effort in the original design. Therefore, a renovated design of a LeafSpec with increased efficiency and imaging quality for dicot leaves is presented in this paper. The new design collects an image of a dicot leaf within 20 s. The data quality of this new device is validated by detecting the effect of nitrogen treatment on soybean plants. The improved spatial resolution allows users to utilize the Normalized Difference Vegetative Index (NDVI) spatial distribution heatmap of the entire leaf to predict the nitrogen content of a soybean plant. This preliminary NDVI distribution analysis result shows a strong correlation (R² = 0.871) between the image collected by the device and the nitrogen content measured by a commercial laboratory. Therefore, it is concluded that the new LeafSpec-Dicot device can provide high-quality hyperspectral leaf images with high spatial resolution, high spectral resolution, and increased throughput for more accurate phenotyping. This enables phenotyping researchers to develop novel HSI image processing algorithms to utilize both spatial and spectral information to reveal more signals in soybean leaf images.