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TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing.

David Landers1, Ian Clancy1, Rafal E Dunin-Borkowski2

  • 1Department of Physics, University of Limerick, Limerick, Munster, V94 T9PX, Ireland.

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|April 20, 2023
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Summary

This study introduces TEMGYM Advanced, a free, open-source software for electron microscopy. It accurately models electron beam trajectories and aberrations, aiding in the development of digital twins for electron microscopes.

Keywords:
Aberration IntegralDifferential AlgebraNanoMiParallelisationRay Tracing

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Area of Science:

  • Physics
  • Materials Science
  • Computational Science

Background:

  • Commercial software for electron beam trajectory characterization is often inaccessible and proprietary.
  • There is a need for open-source tools to analyze electron optics and aberrations in electron microscopes.

Purpose of the Study:

  • Introduce TEMGYM Advanced, a free and open-source software for electron beam trajectory analysis.
  • Implement and validate ray tracing methods for calculating electron lens properties and aberrations.
  • Facilitate the creation of a digital twin for electron microscopes.

Main Methods:

  • Utilized ray tracing methods to simulate electron paths through magnetic and electrostatic lenses.
  • Implemented two independent methods (aberration integral and differential algebra) for aberration coefficient validation.
  • Demonstrated parallelized electron ray tracing for near real-time beam-spot generation.

Main Results:

  • TEMGYM Advanced accurately calculates first-order electron lens properties and third-order geometric aberrations.
  • Validation confirmed the reliability of the implemented aberration calculation methods.
  • Parallelized ray tracing enables rapid, physically accurate beam-spot generation, advancing digital twin development.

Conclusions:

  • TEMGYM Advanced provides an accessible, open-source solution for electron lens characterization in electron microscopy.
  • The software supports the growing ecosystem of open-source tools and facilitates machine learning applications for electron microscope automation.
  • Availability under GPL 3 license promotes community contribution and adoption.