A Method for Spatially Registered Microprofilometry Combining Intensity-Height Datasets from Interferometric Sensors

Area of Science:

• Heritage Science
• Materials Science
• Optical Metrology

Background:

• Profilometry for artworks lacks spatial referencing for micrometer-scale topography.
• Existing methods struggle to align height data with visually discernible surface features.

Purpose of the Study:

• To develop a novel workflow for spatially referenced microprofilometry of heterogeneous artworks in situ.
• To integrate raw intensity signals and height data for improved surface topography analysis.

Main Methods:

• Utilized conoscopic holography sensors for in situ scanning of artworks.
• Combined raw intensity signals with interferometric height datasets.
• Achieved mutual registration between the dual datasets for precise spatial referencing.

Main Results:

• Developed a dual-dataset approach providing surface topography registered to artwork features.
• Raw intensity maps revealed material texture, color variations, and artist marks.
• Demonstrated reliable processing of microtexture for diagnostic tasks and multi-temporal monitoring.

Conclusions:

• The novel workflow enables accurate spatial referencing in microprofilometry of artworks.
• The method enhances quantitative surface metrology and qualitative morphological inspection.
• This approach is expected to advance microprofilometry applications in heritage science.