Biasing of Metal-Semiconductor Junctions
Biasing of P-N Junction
P-N junction
Metal-Semiconductor Junctions
Bipolar Junction Transistor
Types of Semiconductors
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Mengfan Xue1, Zhiqiang Chu1, Dongjian Jiang2
1Eco-Materials and Renewable Energy Research Center (ERERC), Jiangsu Key Laboratory for Nano Technology, National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093, China.
Researchers discovered photo-induced bipolarity in semiconductor surface layers, revealing new electron and hole transfer mechanisms for solar energy applications like photocatalysis.
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