Atomic Emission Spectroscopy: Lab
Atomic Emission Spectroscopy: Overview
X-ray Imaging
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Updated: Jul 31, 2025

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
T Nagayama1, M A Schaeuble1, J R Fein1
1Sandia National Laboratories, Albuquerque, New Mexico 87123, USA.
A new general formula models non-focusing x-ray diagnostics, improving accuracy in high-energy-density experiments. This unified approach enhances data processing and simulation testing for x-ray imagers and spectrometers.
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