Related Experiment Video
Updated: Jul 31, 2025

12:32
The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
Published on: May 24, 2020
8.8K
Publisher Correction: 2D fin field-effect transistors integrated with epitaxial high-k gate oxide
Congwei Tan1, Mengshi Yu1, Junchuan Tang1
1Center for Nanochemistry, Beijing Science and Engineering Center for Nanocarbons, Beijing National Laboratory for Molecular Sciences, College of Chemistry and Molecular Engineering, Peking University, Beijing, China.
Nature
|May 3, 2023
Abstract
No abstract available in PubMed .
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